Tokyo Electronics Trading Co., Ltd.

Tokyo Electronics Trading Co., Ltd. (TET) is a Japanese company headquartered in Tachikawa, Tokyo, that specializes in electrostatic discharge (ESD) countermeasures and high-voltage, high-speed pulse technology. Founded in 1977, the company has supported the ESD and static-control needs of numerous semiconductor and electronic-component manufacturers, and it has built on that accumulated expertise to manufacture and sell measurement instruments and analysis systems. Its business spans ESD testing, static-control consulting and products, test-room rental services, customization, and overseas import/export of electronic equipment. The company's product portfolio centers on reliability evaluation of semiconductors and electronic components against electrostatic breakdown (ESD/CDM) and latch-up. Its lineup includes fully automatic ESD/CDM/latch-up testers, manual ESD and CDM testers, TLP (transmission line pulse) test systems, CMR testers, and wafer probers, conforming to domestic and international standards such as JEITA, JEDEC, ESDA, and AEC. TET also offers ESD event detectors and charge monitors, such as the EV-10A series, which detect ESD and dynamic charge induction (DCI) events on production and assembly lines to help improve yield. TET positions itself around a philosophy of "craftsmanship" — the spirit of continuous effort to make products even slightly better — and works alongside customers under this principle. Beyond equipment sales, it provides technical support, test-equipment rental, and contracted test/evaluation services. In 2026 it announced the renewal of its ESD test equipment and the opening of an in-house ESD test room, offered as an "ESD test room rental service" from April 2026, with a limited-time renewal campaign. The company remains privately held and operates primarily in Japan while also engaging in overseas import/export trade.

Tokyo Electronics Trading Co., Ltd. was established on July 19, 1977, in Tokyo, Japan, with initial capital of 4 million yen. According to the company's own history, it began as the Japanese distributor for U.S. firms Autek System and Interface Technology, selling their products while also starting development of system products. The company subsequently relocated within Tokyo and increased its capital over the following years: to 8 million yen in 1978, 12 million yen in 1983, and 16 million yen in 1985. In 1984 TET launched its LSI electrostatic breakdown (ESD) evaluation system, marking a deepening focus on ESD and static-control technology for the semiconductor industry. In 1987 it developed a latch-up tester. In 1990, under a VEC individual guarantee, it developed the FACT IV, and also developed the AC parameter automatic measurement system 'TECP-8'. In 1991, again under a VEC individual guarantee, it developed the CDM tester 'ESPIER1000' for device and electronic component testing. In 1996 it received a Tokyo Metropolitan Government award related to ESD. Over the decades, TET has supported the ESD and static-control needs of many semiconductor and electronic-component manufacturers. Building on the high-voltage and high-speed pulse technology it accumulated in that work, the company expanded into the manufacture and sale of measurement instruments and analysis systems. Its current business lines include ESD testing, static-control products and services, test-room rental, customization, and overseas import/export. Its product range covers fully automatic ESD/CDM/latch-up testers, multi-pin high-speed testers, ESD/CDM/TLP simulators, TLP test systems, CMR testers, and wafer probers, conforming to JEITA, JEDEC, ESDA, and AEC standards. In 2026 the company renewed its ESD test equipment and opened an in-house ESD test room, offered as a rental service from April 2026.

• 2026

  Renewed ESD test equipment and opened in-house ESD test room, offered as rental service from April 2026.

• 1996

  Received a Tokyo Metropolitan Government award related to ESD.

• 1991

  Developed CDM tester 'ESPIER1000' for device and electronic component testing under VEC individual guarantee.

• 1990

  Developed FACT IV under VEC individual guarantee; developed AC parameter automatic measurement system 'TECP-8'.

• 1987

  Developed latch-up tester.

• 1985

  Capital increased to 16 million yen.

• 1984

  Launched LSI electrostatic breakdown (ESD) evaluation system.

• 1983

  Capital increased to 12 million yen.

• 1978

  Capital increased to 8 million yen.

• 1977

  Founded on July 19 in Tokyo with capital of 4 million yen; began as Japanese distributor for U.S. firms Autek System and Interface Technology and started system product development.

Specialist supplier of ESD countermeasures, high-voltage/fast-pulse measurement instruments, and semiconductor reliability test equipment, guided by a craftsmanship philosophy and long-standing relationships with semiconductor and electronic-component makers.

• M1100-CDM

  Fully automatic CDM tester with up to 4000V applied voltage, for ICs.

• LUP-64

  Latch-up tester with 64 pins and up to 8000V applied voltage, for ICs and modules.

• M1100

  Fully automatic ESD/CDM/latch-up tester with 128 internal pins, 256 external pins, up to 8000V, for ICs and modules.

• M1200

  Fully automatic ESD/CDM/latch-up tester for ICs and modules.

• M7000B / M7000XB

  Multi-pin high-speed testers with 256/512 internal pins, 512/1024 external pins, up to 8000V, for multi-pin ICs.

• Ecdm-100EC / Ecdm-400EC / Ecdm-800EC

  ESD/CDM/TLP simulators with up to 1000V/4000V/8000V, for MR heads, semiconductor electronic components.

• Ecdm-400SW / Ecdm-400SC / Ecdm-400S-AUTO / Ecdm-800S-AUTO / Ecdm-400S-TLP

  ESD/CDM/TLP simulators for wafers, chip components, LED electronic components, and semiconductor electronic components.

• TLP tester models 4002/4012

  World's first commercial TLP test system with built-in leak measurement and ultra-fast snap-back measurement.

• CMR tester model 6250

  dv/dt high-voltage pulse generator with pulse output voltage ±100V to ±1.5KV and selectable dv/dt of 1KV/us to 30KV/us.

• Manual wafer prober models SE-1000/6003

  X-Y stage movement X-axis 200mm, Y-axis 200mm; X-Y sub-stage movement φ305mm; sample stage rotation coarse 180°, fine 10°.

• ESD event detector model EV-10A series

  Detects ESD and DCI (dynamic charge induction) events and collects data to a PC; about 10x more sensitive than previous models, 2GHz wideband; can be used standalone.

1. 1静電気(ESD)とパルス技術の[東京電子交易株式会社]tet.co.jp
2. 2会社紹介｜東京電子交易株式会社tet.co.jp
3. 3静電気(ESD)の信頼性試験｜装置一覧｜東京電子交易株式会社tet.co.jp
4. 4【静電気放電・帯電モニタ】ESDイベント・ディテクタ｜東京電子交易株式会社tet.co.jp
5. 5Tokyo Electronics Trading Co., Ltd. (Japan) - Wikidatawikidata.org